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OP1021 Launch Condition Analyzer
This Launch Condition Analyzer analyses the Nearfiled as well as the Farfield of launch cables and sources over a wide wavelength range.
- Product Specifications
- Product Features
- Downloads
| Farfield Analyzer | |
| Scan Range, angular | -0.5NA to +0.5NA
-0.5 rad to +0.5rad |
| Scanning Resolution | 0.018rad (+/-0.004) |
| Scan speed | 60 sec. |
| Wavelength Range | 830nm..1700nm (InGaAs Detector) |
| Optical Power Range | +20dBm to -45dBm |
| Optical Interface | universal 2.5mm |
| Nearfiled Analyzer | |
| Scan Range, linear | -150µm to +150µm |
| Scan Resolution | 0.2µm |
| Wavelength Range | 830nm..1700nm (InGaAs Detector) |
| Optical Power Range | +20dBm to -45dBm |
| Optical Interface | universal 2.5mm |
The OP1021 combines a versatile Nearfiled Scanner with a Farfield
Scanner into a single instrument.
Nearfiled Analyzer
The Nearfiled (NF) describes the optical power density on the
surface of a radiating source or the end of a fiber. The near field
measurement can determine the refractive index profile of multimode
fibers and the fiber's mode filling.
With the included application OPL_LCA the Encircled Flux measurement
is calculated and analyzed against the appropriate IEC template.
Farfield Analyzer
The Farfield (FF) measurement is the optical power density of a
source or fiber end on a surface measured at a radial distance.
The farfield measurement can determine the numerical aperture of
sources and fibers.
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