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OP1021 Launch Condition Analyzer

This Launch Condition Analyzer analyses the Nearfiled as well as the Farfield of launch cables and sources over a wide wavelength range.

 

 

 

 

 

 

 

  • Product Specifications
  • Downloads
  • Product Features

 

Specifications

Farfield Analyzer
Scan Range, angular -0.5NA to +0.5NA
-0.5
rad to +0.5rad
Scanning Resolution 0.018rad (+/-0.004)
Scan speed 60 sec.
Wavelength Range 830nm..1700nm (InGaAs Detector)
Optical Power Range +20dBm to -45dBm
Optical Interface universal 2.5mm
Nearfiled Analyzer
Scan Range, linear -150µm to +150µm
Scan Resolution 0.2µm
Wavelength Range 830nm..1700nm (InGaAs Detector)
Optical Power Range +20dBm to -45dBm
Optical Interface universal 2.5mm

 

 

Downloads

  • [PDF] Product Datasheet for OP1021 Launch Conditions Analyzer
  • [EXE] OPL-LCA Application Software for Windows.
  • [PDF] OP1021 and OPL-LCA Manual
  • [PDF] Overview Launch Condition & Encircled Flux

 

 

Features

The OP1021 combines a versatile Nearfiled Scanner with a Farfield Scanner into a single instrument.

Nearfiled Analyzer
The Nearfiled (NF) describes the optical power density on the surface of a radiating source or the end of a fiber. The near field measurement can determine the refractive index profile of multimode fibers and the fiber's mode filling.
With the included application OPL_LCA the Encircled Flux measurement is calculated and analyzed against the appropriate IEC template.



Farfield Analyzer
The Farfield (FF) measurement is the optical power density of a source or fiber end on a surface measured at a radial distance. The farfield measurement can determine the numerical aperture of sources and fibers.

 

 

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