| Farfield Analyzer |
| Scan Range, angular |
-0.5NA to +0.5NA
-0.5
rad to +0.5rad |
| Scanning Resolution |
0.018rad (+/-0.004) |
| Scan speed |
60 sec. |
| Wavelength Range |
830nm..1700nm (InGaAs Detector) |
| Optical Power Range |
+20dBm to -45dBm |
| Optical Interface |
universal 2.5mm |
| Nearfiled Analyzer |
| Scan Range, linear |
-150µm to +150µm |
| Scan Resolution |
0.2µm |
| Wavelength Range |
830nm..1700nm (InGaAs Detector) |
| Optical Power Range |
+20dBm to -45dBm |
| Optical Interface |
universal 2.5mm |
The OP1021 combines a versatile Nearfiled Scanner with a Farfield
Scanner into a single instrument.
Nearfiled Analyzer
The Nearfiled (NF) describes the optical power density on the
surface of a radiating source or the end of a fiber. The near field
measurement can determine the refractive index profile of multimode
fibers and the fiber's mode filling.
With the included application OPL_LCA the Encircled Flux measurement
is calculated and analyzed against the appropriate IEC template.

Farfield Analyzer
The Farfield (FF) measurement is the optical power density of a
source or fiber end on a surface measured at a radial distance.
The farfield measurement can determine the numerical aperture of
sources and fibers.
[PDF] Product Datasheet
for OP1021 Launch Conditions Analyzer
[EXE] OPL-LCA Application
Software for Windows.
[PDF] OP1021 and
OPL-LCA Manual
[PDF] Overview Launch Condition & Encircled Flux