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OP1021 Launch Condition Analyzer

This Launch Condition Analyzer analyses the Nearfiled as well as the Farfield of launch cables and sources over a wide wavelength range.

    The OP1021 combines a versatile Nearfiled Scanner with a Farfield Scanner into a single instrument.

    Nearfiled Analyzer
    The Nearfiled (NF) describes the optical power density on the surface of a radiating source or the end of a fiber. The near field measurement can determine the refractive index profile of multimode fibers and the fiber's mode filling.
    With the included application OPL_LCA the Encircled Flux measurement is calculated and analyzed against the appropriate IEC template.



    Farfield Analyzer
    The Farfield (FF) measurement is the optical power density of a source or fiber end on a surface measured at a radial distance. The farfield measurement can determine the numerical aperture of sources and fibers.

    Farfield Analyzer
    Scan Range, angular -0.5NA to +0.5NA
    -0.5
    rad to +0.5rad
    Scanning Resolution 0.018rad (+/-0.004)
    Scan speed 60 sec.
    Wavelength Range 830nm..1700nm (InGaAs Detector)
    Optical Power Range +20dBm to -45dBm
    Optical Interface universal 2.5mm
    Nearfiled Analyzer
    Scan Range, linear -150µm to +150µm
    Scan Resolution 0.2µm
    Wavelength Range 830nm..1700nm (InGaAs Detector)
    Optical Power Range +20dBm to -45dBm
    Optical Interface universal 2.5mm

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